precision optical metrology solutions and components for universities and the scientific community
precision optical metrology solutions and components for universities and the scientific community
Metrology
Opto-Line’s Metrology services provide precision components for calibration, measurements and alignments.
From 1951 USAF targets to many custom reticles and resolution targets, Opto-Line provides universities and scientific companies with the precision metrology components for calibration, measurements and alignment.
Metrology is the science of measurement and includes all theoretical and practical aspects of measurement.
Metrology is defined by the International Bureau of Weights and Measures (BIPM) as “the science of measurement, embracing both experimental and theoretical determinations at any level of uncertainty in any field of science and technology.” The ontology and international vocabulary of metrology (VIM) is maintained by the Joint Committee for Guides in Metrology(JCGM), a group made up of eight international organisations – BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, and ILAC.
Metrology
Metrology is a very broad field and may be divided into three basic activities though there is considerable overlap between these activities:
- Definition of internationally accepted units of measurement
- Realisation of these units of measurement in practice
- Application of chains of traceability linking measurements made in practice to reference standards
Custom resolution pattern using Opto-Line’s low reflecting black chrome
Custom resolution patterns within each grid. Critical dimension: 2μm
1951 USAF Test Resolution Target with a 1μm feature size: negative tone
1951 USAF Test Resolution Target on white ivory glass
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