
Opto-Line specializes in custom precision optical patterns manufactured to customer specifications using advanced photolithography and thin film coating technologies. From precision reticles, apertures, multi-density resolution masks, neutral density filters, calibration test targets, EMI grids, and contrast test targets to custom photoresist coating solutions, our capabilities support demanding applications across the aerospace, defense, medical, metrology, and […]

What are optical metrology services, and why are they important? Optical metrology uses precision optical components to support accurate calibration, measurement verification, and alignment across scientific, research, and industrial applications. Opto-Line provides custom optical metrology solutions, including 1951 USAF resolution targets, custom reticles, and precision measurement patterns designed to help universities, laboratories, and technology organizations […]

Beam splitter patterns play a critical role in many optical systems where precise light distribution, measurement accuracy, and system performance are essential. By directing, dividing, or shaping light in highly controlled ways, custom beam splitter patterns can support a wide range of applications across imaging, metrology, instrumentation, alignment, sensing, and other advanced optical environments. At […]

Opto-Line is an industry leader in the manufacturing of precision reticles, proudly serving hundreds of world-wide markets from aerospace to research and development. Opto-Line International’s services include multi-density resolution masks, neutral density filters, reticle patterns, precision apertures, calibration test targets, EMI grids, photolithographic services, contrast test targets, and many more. Patterns can be made from various […]

Your Specifications, Your Way. From endoscope apertures to EMI grids, Opto-Line will customize your optical patterns. Opto-Line is an industry leader in the manufacturing of custom precision optical patterns for companies in the Aerospace, Defense, Medical, and Science industries. Learn more about our products and services: Apertures Beam Splitters EMI Grids Lens Patterning Multi-Density Resolution […]

Examples of Opto-Line’s custom patterning capabilities include reticles, resolution test targets, EMI grids, apertures, linear scales, and neutral density step tablets. We’d love to hear from you. Please tell us more about your custom optical pattern needs. Opto-Line International, Inc. is a customer oriented small business that strives to provide outstanding quality and service. From […]

Opto-Line provides world-class solutions in the area of Research and Development. Our innovative approach and ability to tackle the most complex projects make us the premier reticle vendor to call upon for your R&D needs. Often times our custom patterns are vital in the R&D phase of a product. Opto-Line has a long history of […]

Opto-Line International has been creating custom precision patterns on optics since 1967. We’d love to hear about your custom reticle needs and invite you to learn more today. From reticles and apertures to multi-density resolution masks and almost any pattern imaginable, our photolithography and thin film coatings practices are optimized to create your final parts. […]

Applications for some of our products include satellite navigation systems, endoscopy, optometry, modulated contrast microscope objectives, electro-optical devices, optical system calibration, photolithographic systems, Mylar and Kapton patterning, silicon wafer blanket photo resist coatings, surveillance systems, and microscopy. Learn more about Opto-Line’s services and solutions or reach out today – we’d love to hear more about […]

A beam splitter is a device for dividing a beam of light or other electromagnetic radiation into two or more separate beams. Opto-Line builds high-performance polka-dot Beam Splitter patterns that are ideal for numerous optical systems. Offering a distinct advantage over standard dielectric beamsplitters, Polka-Dot Beamsplitters have a constant reflection/transmission ratio over a large spectral […]