Tagged: Custom test targets

From 1951 USAF resolution test charts to almost any custom test targets imaginable, Opto-Line can produce any pattern with pinpoint precision and accuracy. Reach out to learn more about how we can meet your custom or standard Test Target needs.

January 30th, 2024 | Custom test targets

Meeting all MIL standards, Opto-Line produces the finest optical patterns to meet our clients’ custom or standard Test Target needs It is still widely accepted to test the resolution of optical imaging systems such as microscopes, cameras and image scanners. For the 1951 USAF, the common format consists of six “groups” in three layers of […]

Meeting all MIL standards, Opto-Line produces only the finest optical patterns to meet your custom or standard Test Target needs. We invite you to reach out to learn more.

November 16th, 2022 | Custom test targets

From 1951 USAF resolution test charts to almost any custom test targets imaginable, Opto-Line  can produce any pattern you may need with the precision and quality you should expect.  

Opto-Line produces the finest optical patterns to meet your custom or standard Test Target needs, meeting all MIL standards. We look forward to hearing about your needs – reach out today to learn more.

May 26th, 2022 | Custom test targets

From 1951 USAF resolution test charts to almost any custom test targets imaginable, Opto-Line can produce any pattern you need with pinpoint precision and accuracy. It is still widely accepted to test the resolution of optical imaging systems such as microscopes, cameras and image scanners. For the 1951 USAF, the common format consists of six […]

From 1951 USAF resolution test charts to almost any custom test targets imaginable, Opto-Line can produce any pattern you need with pinpoint precision and accuracy.

July 27th, 2021 | Custom test targets

Opto-Line produces the finest optical patterns to meet your custom or standard Test Target needs, meeting all MIL standards. It is still widely accepted to test the resolution of optical imaging systems such as microscopes, cameras and image scanners. For the 1951 USAF, the common format consists of six “groups” in three layers of patterns. […]

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